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Welcome to the Conference

The 15th International Conference "Beam Injection Assessment of Microstructures in Semiconductors" (BIAMS) continues a successful series of conferences, which started in Meudon, France, in 1988. The conference BIAMS2020 is the direct follower of the conference of 2018 held in Seoul, Korea. BIAMS2020 will be held in Saint Petersburg (Russia) from July 19 to 24, 2020.

The Conference will act as a forum for interaction between physicists, materials scientists and technologists; it gathers scientists from all over the world to present advances in the field of the physical characterization of semiconductors by means of beam injection and related methods. Application fields are broad: photovoltaic, micro- and nano-electronics, device degradation, semiconductor defects, reverse engineering, nanophotonics, quantum optics, etc.

The location of the conference, Saint Petersburg, is both a scientific and a cultural center. It is a beautiful city designed and built by Russian and Western architects. It is often called "the Venice of the North". As usual along with the Scientific Session, a Social Program is planned. The organizers will arrange a sightseeing program to introduce St Petersburg to the guests and accompanying persons. BIAMS2020 will be held in the period of "white nights", when the city looks especially beautiful.

BIAMS2020 is organized by Laboratory of Diffusion and Defect Formation in Semiconductors of Ioffe Institute, involved in Solid State Physics researches. We very much hope that you will attend BIAMS2020 and find the conference both enjoyable and valuable. We look forward to meeting you in Saint Petersburg, Russia.


Maria Zamoryanskaya, Conference Chair

and the Organizing Committee